DocumentCode
926701
Title
Variation of Transistor Parameters with Temperature
Author
Coblenz, Abraham ; Owens, Harry L.
Author_Institution
Signal Corps Engineering Laboratories, Fort Monmouth, N.J.
Volume
40
Issue
11
fYear
1952
Firstpage
1472
Lastpage
1476
Abstract
In this paper results of a study to determine the temperature dependence of the electrical characteristics of Type 1698 and 1768 transistors are given. Variations of transistor parameters as a function of temperature are given for each type of unit. Cumulative distribution curves are also given for the transistors studied. The implications of the results obtained with regard to transistor operation at elevated temperatures are discussed briefly.
Keywords
Circuit testing; Current measurement; Electric variables; Electrical resistance measurement; Frequency measurement; Laboratories; Temperature dependence; Temperature distribution; Voltage; Voltmeters;
fLanguage
English
Journal_Title
Proceedings of the IRE
Publisher
ieee
ISSN
0096-8390
Type
jour
DOI
10.1109/JRPROC.1952.273981
Filename
4050853
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