Title :
Switching-time statistics for a ramp-excited tunnel diode switch (Corresp.)
Author :
Nelsen, Donald E. ; O´Neil, E.
fDate :
5/1/1977 12:00:00 AM
Abstract :
An analytical model is developed which yields switching-time jitter statistics for a tunnel diode excited by a current ramp. For appropriate wide-band noise, a "switch sensitivity period" is defined over which a weighted average (a stochastic integral)of the noise specifies the deviation in the switching time. The predictions agree with experimental results.
Keywords :
Level-crossing problems; Semiconductor diode switches; Timing jitters; Tunnel-diode circuits; Circuit noise; Communication switching; Diodes; Jitter; Low-frequency noise; Statistics; Switches; Switching circuits; Viterbi algorithm; Wideband;
Journal_Title :
Information Theory, IEEE Transactions on
DOI :
10.1109/TIT.1977.1055708
