• DocumentCode
    926778
  • Title

    VC-dimension of exterior visibility

  • Author

    Isler, Volkan ; Kannan, Sampath ; Daniilidis, Kostas ; Valtr, Pavel

  • Author_Institution
    Dept. of Comput. & Inf. Sci., Pennsylvania Univ., Philadelphia, PA, USA
  • Volume
    26
  • Issue
    5
  • fYear
    2004
  • fDate
    5/1/2004 12:00:00 AM
  • Firstpage
    667
  • Lastpage
    671
  • Abstract
    In this paper, we study the Vapnik-Chervonenkis (VC)-dimension of set systems arising in 2D polygonal and 3D polyhedral configurations where a subset consists of all points visible from one camera. In the past, it has been shown that the VC-dimension of planar visibility systems is bounded by 23 if the cameras are allowed to be anywhere inside a polygon without holes. Here, we consider the case of exterior visibility, where the cameras lie on a constrained area outside the polygon and have to observe the entire boundary. We present results for the cases of cameras lying on a circle containing a polygon (VC-dimension=2) or lying outside the convex hull of a polygon (VC-dimension=5). The main result of this paper concerns the 3D case: We prove that the VC-dimension is unbounded if the cameras lie on a sphere containing the polyhedron, hence the term exterior visibility.
  • Keywords
    cameras; computational geometry; set theory; visibility; 2D polygonal configurations; 3D polyhedral configurations; Vapnik-Chervonenkis dimension; camera; exterior visibility; planar visibility system; subset; Art; Broadband antennas; Broadband communication; Cameras; Inspection; Receiving antennas; Rendering (computer graphics); Robot vision systems; Sampling methods; Surveillance; Algorithms; Artificial Intelligence; Cluster Analysis; Computer Simulation; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Information Storage and Retrieval; Numerical Analysis, Computer-Assisted; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Signal Processing, Computer-Assisted; Subtraction Technique;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2004.1273987
  • Filename
    1273987