Neurogenetic design centering

A new technique for design centering and yield enhancement of devices and circuits is presented. The proposed method uses neural networks for device and/or circuit modeling and genetic algorithms for parametric yield optimization. It uses a Monte Carlo-based method for yield estimation via the neural models (thus consuming less time) and genetic algorithms for efficient design centering. The neurogenetic methodology has been used for design centering of SiGe heterojunction transistors and millimeter-wave voltage controlled oscillators. It results in significant yield enhancement of the SiGe heterojunction bipolar transistors (from 25% to 75%) and voltage controlled oscillators (from 8 % to 85 %). To the best of our knowledge, this method has not been reported previously.