DocumentCode :
927059
Title :
Scheduling single-armed cluster tools with reentrant wafer flows
Author :
Lee, Hwan-Yong ; Lee, Tae-Eog
Author_Institution :
High Definition Display Center LCD, Samsung Electron. Co. Ltd, Chungcheongnam-Do, South Korea
Volume :
19
Issue :
2
fYear :
2006
fDate :
5/1/2006 12:00:00 AM
Firstpage :
226
Lastpage :
240
Abstract :
A cluster tool for semiconductor manufacturing consists of several single-wafer processing chambers and a wafer-handling robot in a closed environment. The use of cluster tools is extended to reentrant processes such as atomic layer deposition, where a wafer visits a processing chamber more than once. Such a reentrant wafer How complicates scheduling and control of the cluster tool and often causes deadlocks. We examine the scheduling problem for a single-armed cluster tool with various reentrant wafer flows. We develop a convenient method of modeling tool operational behavior with reentrant wafer flows using Petri nets. By examining the net model, we then develop a necessary and sufficient condition for preventing a deadlock. We also show that the cycle time for the asymmetric choice Petri net model for a reentrant wafer How can be easily computed by using the equivalent event graph model. From the results, we systematically develop a mixed integer programming model for determining the optimal tool operation sequence, schedule, and cycle time. We also extend a workload measure for cluster tools with reentrant wafer flows. Finally, we discuss how our results can be used for engineering a cluster tool. We compare two proposed strategies, sharing and dedicating, of operating the parallel processing chambers for identical process steps.
Keywords :
Petri nets; cluster tools; electronics industry; integer programming; scheduling; Petri nets; atomic layer deposition; cluster tools; equivalent event graph model; integer programming model; optimal tool operation; parallel processing chambers; reentrant wafer flows; scheduling problem; semiconductor manufacturing; tool operational behavior; wafer-handling robot; workload measure; Atomic layer deposition; Job shop scheduling; Linear programming; Manufacturing processes; Petri nets; Robots; Semiconductor device manufacture; Semiconductor device modeling; Sufficient conditions; System recovery; Cluster tools; Petri net; deadlock; reentrant wafer flow; scheduling;
fLanguage :
English
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/TSM.2006.873402
Filename :
1628985
Link To Document :
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