DocumentCode
927270
Title
Comparison of noise-measured and theoretical value of base spreading resistance for an interdigitated transistor
Author
Knott, K.F. ; Unwin, R.T.
Author_Institution
University of Salford, Department of Electrical Engineering, Salford, UK
Volume
11
Issue
7
fYear
1975
Firstpage
147
Lastpage
148
Abstract
The base spreading resistance of a bipolar interdigitated transistor has been measured by a noise-measuring technique. The results compare favourably with calculation.
Keywords
bipolar transistors; noise measurement; resistance (electric); base spreading resistance; bipolar interdigitated transistor; noise measuring technique;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19750112
Filename
4236624
Link To Document