DocumentCode :
927515
Title :
High efficiency MOS charge pumps based on exponential-gain structure with pumping gain increase circuits
Author :
Chang, Lon-Kou ; Hu, Chih-Huei
Author_Institution :
Electr. & Control Eng. Dept., Nat. Chiao Tung Univ., Hsinchu
Volume :
21
Issue :
3
fYear :
2006
fDate :
5/1/2006 12:00:00 AM
Firstpage :
826
Lastpage :
831
Abstract :
Novel MOS charge pumps utilizing an exponential-gain structure and pumping gain increase (PGI) circuits with high voltage transfer efficiency to generate boosted output voltages are described. By using the PGI circuits, the threshold voltage problem of the MOSFET used as a switch is solved, and the limitation of the diode-configured output stage is removed. Thus, the boosted output voltage increases linearly as compared to the pumping stage number. An exponential-gain structure is also presented as a further application of the PGI circuit. By using this structure, fewer voltage pump stages are needed to obtain the required output voltage. For 1.5-V supply voltage operation, a four-time series (1.5 V-to-6 V) is demonstrated using the new techniques. Simulation and experimental results have shown that this design has good efficiency with a low-input supply voltage such as a one battery cell
Keywords :
MOS integrated circuits; voltage multipliers; 1.5 to 6 V; MOSFET; diode-configured output stage; exponential-gain structure; high efficiency MOS charge pumps; high voltage transfer efficiency; pumping gain increase circuits; voltage pump stages; Charge pumps; Costs; DC generators; DC-DC power converters; Degradation; Diodes; MOSFET circuits; Switches; Switching circuits; Threshold voltage; Charge pump; dc/dc converter; high-voltage generator; voltage multiplier;
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/TPEL.2006.874795
Filename :
1629025
Link To Document :
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