• DocumentCode
    927755
  • Title

    Thermally induced FM noise in Gunn oscillators and jitter in Gunn-effect digital devices

  • Author

    Tanimoto, M. ; Yanai, H. ; Sugeta, T.

  • Author_Institution
    University of Tokyo, Tokyo, Japan
  • Volume
    61
  • Issue
    8
  • fYear
    1973
  • Firstpage
    1138
  • Lastpage
    1139
  • Abstract
    By considering the fluctuation of the starting time of domain formation and that of domain formation time, an expression for thermally induced FM noise in Gunn oscillators is derived. The result is in good agreement with experimental data. These results are applied to estimate thermally induced jitter in Gunn-effect digital devices.
  • Keywords
    Circuit noise; Diodes; Fluctuations; Frequency; Gunn devices; Jitter; Noise level; Oscillators; Thermal resistance; Voltage;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1973.9215
  • Filename
    1451145
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=927755