• DocumentCode
    927805
  • Title

    Current Multiplication in the Type-A Transistor

  • Author

    Sittner, W.R.

  • Author_Institution
    Bell Telephone Laboratories, Allentown Laboratory, 555 Union Blvd., Allentown, Pa.
  • Volume
    40
  • Issue
    4
  • fYear
    1952
  • fDate
    4/1/1952 12:00:00 AM
  • Firstpage
    448
  • Lastpage
    454
  • Abstract
    One of the basic phenomena exhibited by transistors is current multiplication. In transistors of the point-contact type (one of these has been called the type A), the mechanism giving rise to this effect has been somewhat uncertain. Four possible mechanisms of the current multiplication process in the type-A transistor are discussed. One of the mechanisms is based on trapping holes in the collector barrier of the semiconductor. By means of this trapping model, the effect of emitter current and temperature on the current multiplication is predicted. It is shown that these predictions are in reasonable accord with experiment. Furthermore, assuming this model to hold, the trap density and activation energy (produced by forming) may be evaluated.
  • Keywords
    Charge carrier processes; Electron emission; Equivalent circuits; Germanium; Laboratories; Predictive models; Semiconductor device modeling; Telephony; Temperature; Wires;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IRE
  • Publisher
    ieee
  • ISSN
    0096-8390
  • Type

    jour

  • DOI
    10.1109/JRPROC.1952.274039
  • Filename
    4050969