Title :
Stability criteria for negative-resistance oscillators
Author :
Scanlan, J.O. ; Brazil, Thomas J.
Author_Institution :
University College, Department of Electrical & Electronic Engineering, Dublin, Ireland
Abstract :
The stability criterion for a free-running negative-resistance oscillator is shown to be invariant to transformation through a wide class of 2-port networks connecting the device terminals to a convenient reference plane in the external circuit. In this way, the experimental application of the criterion to a given circuit is greatly simplified.
Keywords :
microwave oscillators; negative resistance effects; nonlinear network analysis; solid-state microwave circuits; stability criteria; 2-port networks; free running; negative resistance oscillators; stability criteria; transformation invariant;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19750195
