Title :
Electro-optic thin films of zinc sulphide
Author :
Jones, Paul L. ; Al-Khateeb, K.A.H.
Author_Institution :
University of Manchester, Electrical Engineering Laboratories, Manchester, UK
Abstract :
Highly ordered single-crystal films of cubic zinc sulphide are grown epitaxially on silicon substrates by sublimation in u.h.v. The electro-optic coefficients are measured using a sensitive a.c. method and values of r41 up to 6.73×10¿13 mV¿1 are reported.
Keywords :
II-VI semiconductors; integrated optics; optical films; semiconductor thin films; zinc compounds; ZnS; electrooptic coefficients; electrooptic thin films; epitaxial growth; silicon substrates; single crystal films; sublimation; ultra high vacuum;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19750198
