• DocumentCode
    928259
  • Title

    Design of self-checking iterative networks

  • Author

    Dhawan, Sanjeev ; Vries, Ronald C De

  • Author_Institution
    IBM, Austin, TX, USA
  • Volume
    37
  • Issue
    9
  • fYear
    1988
  • fDate
    9/1/1988 12:00:00 AM
  • Firstpage
    1121
  • Lastpage
    1125
  • Abstract
    The relevant definitions are given and a model of self-checking iterative network is presented. A general combinational circuit was developed that is totally self-checking and can detect an error on the input code lines and transmit the error to the output code lines. Thus, an error generated in a cell is transmitted from cell to cell until the last cell is reached. The error, and fault that generated it, can be detected by the checker at the last cell, which can also be made self-checking. The added redundancy increases the amount of logic required to realize the circuit, and the increase depends on the circuit being realized. If z is the number of output code lines for a general cell, a rough estimate of the percent increase in circuitry is 1/z×100
  • Keywords
    combinatorial circuits; error detection; iterated switching networks; combinational circuit; error; iterative network; redundancy; self-checking; Built-in self-test; Circuit faults; Circuit testing; Combinational circuits; Computer errors; DH-HEMTs; Electrical fault detection; Fault detection; Logic design; Redundancy;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.2263
  • Filename
    2263