DocumentCode
928312
Title
Built-in checking of the correct self-test signature
Author
McAnney, W.H. ; Savir, J.
Author_Institution
IBM Corp., Poughkeepsie, NY, USA
Volume
37
Issue
9
fYear
1988
fDate
9/1/1988 12:00:00 AM
Firstpage
1142
Lastpage
1145
Abstract
A procedure is described for determining the initial value of a single or multiple input signature register (used to compress responses in built-in testing) so that the final good-machine signature is always constant, e.g. all zeros. In this way, it is possible to determine if a fault has been detected by ORing the outputs of the register stages. Since the OR operation can be built-in, a single observation of the output of the OR gate will determine if the circuit has passed the test
Keywords
automatic testing; logic testing; built-in testing; initial value; self-test signature; signature register; single observation; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Fault detection; Feedback; Hardware; Polynomials; Shift registers; Strontium;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/12.2268
Filename
2268
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