• DocumentCode
    928312
  • Title

    Built-in checking of the correct self-test signature

  • Author

    McAnney, W.H. ; Savir, J.

  • Author_Institution
    IBM Corp., Poughkeepsie, NY, USA
  • Volume
    37
  • Issue
    9
  • fYear
    1988
  • fDate
    9/1/1988 12:00:00 AM
  • Firstpage
    1142
  • Lastpage
    1145
  • Abstract
    A procedure is described for determining the initial value of a single or multiple input signature register (used to compress responses in built-in testing) so that the final good-machine signature is always constant, e.g. all zeros. In this way, it is possible to determine if a fault has been detected by ORing the outputs of the register stages. Since the OR operation can be built-in, a single observation of the output of the OR gate will determine if the circuit has passed the test
  • Keywords
    automatic testing; logic testing; built-in testing; initial value; self-test signature; signature register; single observation; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Fault detection; Feedback; Hardware; Polynomials; Shift registers; Strontium;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.2268
  • Filename
    2268