DocumentCode
928556
Title
Fast Pass-Transistor Simulation for Custom MOS Circuits
Author
Barzilai, Zeev ; Huisman, Leendert M. ; Silberman, Gabriel M. ; Tang, Donald T. ; Woo, Lin S.
Author_Institution
IBM Thomas J. Watson Research Center
Volume
1
Issue
1
fYear
1984
Firstpage
71
Lastpage
81
Abstract
This approach uses the Yorktown Simulation Engine to bridge the gap between electrical and gate-level simulators. It is well-suited to fault simulation and design verification.
Keywords
Analytical models; Circuit faults; Circuit simulation; Circuit testing; Communication switching; Logic design; MOS devices; Signal processing; Very large scale integration;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1984.5005579
Filename
5005579
Link To Document