Title :
Shrinkage estimation of threshold parameter of the exponential distribution [reliability theory]
Author :
Chiou, Paul ; Han, C.P.
Author_Institution :
Dept. of Math., Lamar Univ., Beaumont, TX, USA
fDate :
10/1/1989 12:00:00 AM
Abstract :
The authors study the usual preliminary test estimator of the threshold parameter of the exponential distribution in censored samples. The optimal levels of significance and their corresponding critical values for the preliminary test are obtained. The optimal values of shrinkage coefficients for a preliminary test shrinkage estimator are also obtained on the basis of the minimax regret criterion
Keywords :
life testing; minimax techniques; reliability theory; statistical analysis; censored samples; exponential distribution; life testing; minimax regret criterion; optimal levels of significance; preliminary test estimator; reliability; shrinkage coefficients; shrinkage estimation; threshold parameter; Exponential distribution; Life estimation; Life testing; Mean square error methods; Minimax techniques; Parameter estimation; Reliability theory; State estimation; Statistical analysis; Statistical distributions;
Journal_Title :
Reliability, IEEE Transactions on
