• DocumentCode
    928760
  • Title

    Linking Design&Test

  • Author

    Anderson, Robert E.

  • Author_Institution
    GenRad
  • Volume
    1
  • Issue
    2
  • fYear
    1984
  • fDate
    5/1/1984 12:00:00 AM
  • Firstpage
    27
  • Lastpage
    31
  • Keywords
    Automatic testing; Circuit testing; Integrated circuit technology; Integrated circuit testing; Joining processes; Printed circuits; Semiconductor device testing; Software testing; System testing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.1984.5005604
  • Filename
    5005604