DocumentCode
928760
Title
Linking Design&Test
Author
Anderson, Robert E.
Author_Institution
GenRad
Volume
1
Issue
2
fYear
1984
fDate
5/1/1984 12:00:00 AM
Firstpage
27
Lastpage
31
Keywords
Automatic testing; Circuit testing; Integrated circuit technology; Integrated circuit testing; Joining processes; Printed circuits; Semiconductor device testing; Software testing; System testing;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1984.5005604
Filename
5005604
Link To Document