• DocumentCode
    928836
  • Title

    Testability Emphasis in the General Electric A/VLSI Program

  • Author

    Kroeger, Robert C.

  • Author_Institution
    General Electric
  • Volume
    1
  • Issue
    2
  • fYear
    1984
  • fDate
    5/1/1984 12:00:00 AM
  • Firstpage
    61
  • Lastpage
    65
  • Abstract
    General Electric´s Aerospace Business Group has initiated an extensive Advanced Very Large Scale Integration Program to generate the technology needed to produce 1.25-micron integrated circuits that will substantially improve its military products. This article emphasizes practical real-world experiences encountered in designing for testability. It discusses test-oriented macrocells, design rules, software checks, testability design guidelines, test specification language, and workstation communication with automated test equipment.
  • Keywords
    Aerospace testing; Automatic testing; Circuit testing; Integrated circuit technology; Macrocell networks; Software design; Software testing; Specification languages; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.1984.5005612
  • Filename
    5005612
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=928836