DocumentCode :
928836
Title :
Testability Emphasis in the General Electric A/VLSI Program
Author :
Kroeger, Robert C.
Author_Institution :
General Electric
Volume :
1
Issue :
2
fYear :
1984
fDate :
5/1/1984 12:00:00 AM
Firstpage :
61
Lastpage :
65
Abstract :
General Electric´s Aerospace Business Group has initiated an extensive Advanced Very Large Scale Integration Program to generate the technology needed to produce 1.25-micron integrated circuits that will substantially improve its military products. This article emphasizes practical real-world experiences encountered in designing for testability. It discusses test-oriented macrocells, design rules, software checks, testability design guidelines, test specification language, and workstation communication with automated test equipment.
Keywords :
Aerospace testing; Automatic testing; Circuit testing; Integrated circuit technology; Macrocell networks; Software design; Software testing; Specification languages; Very large scale integration;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1984.5005612
Filename :
5005612
Link To Document :
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