• DocumentCode
    928907
  • Title

    Concurrent error-detectable butterfly chip for real-time FFT processing through time redundancy

  • Author

    Chen, Thou-Ho ; Chen, Liang-Gee

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • Volume
    28
  • Issue
    5
  • fYear
    1993
  • fDate
    5/1/1993 12:00:00 AM
  • Firstpage
    537
  • Lastpage
    547
  • Abstract
    The chip design for a fast Fourier transform (FFT) butterfly module using a novel concurrent error detection (CED) technique is presented. It is a time-redundant realization based on the direct complex computation approach. By the use of symmetry and the exchanging design strategy, the recomputation step can be performed by interleaving the circuits for the real and imaginary parts in a complex function. It leads to a lower hardware overhead (about 7/(4n+8), where n is the word length), and the error detection capability is as robust as that of the duplicated module technique. The CED butterfly is designed in 1.2-μm CMOS technology, using the structural silicon complier. The theoretical analysis and experimental results are presented. It is shown that the design is very attractive for real-time high-reliability DSP systems. Its regular structure make the proposed algorithm and architecture easy to implement in VLSI or WSI
  • Keywords
    CMOS integrated circuits; VLSI; circuit reliability; digital signal processing chips; error detection; fast Fourier transforms; fault tolerant computing; parallel architectures; pipeline processing; real-time systems; redundancy; 1.2 micron; CMOS technology; FFT; VLSI; WSI; butterfly chip; concurrent error detection; direct complex computation; exchanging design strategy; fast Fourier transform; high-reliability DSP systems; real-time FFT processing; recomputation step; structural silicon complier; time redundancy; CMOS technology; Chip scale packaging; Circuits; Digital signal processing; Fast Fourier transforms; Hardware; Interleaved codes; Real time systems; Robustness; Silicon;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.229402
  • Filename
    229402