DocumentCode :
928907
Title :
Concurrent error-detectable butterfly chip for real-time FFT processing through time redundancy
Author :
Chen, Thou-Ho ; Chen, Liang-Gee
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume :
28
Issue :
5
fYear :
1993
fDate :
5/1/1993 12:00:00 AM
Firstpage :
537
Lastpage :
547
Abstract :
The chip design for a fast Fourier transform (FFT) butterfly module using a novel concurrent error detection (CED) technique is presented. It is a time-redundant realization based on the direct complex computation approach. By the use of symmetry and the exchanging design strategy, the recomputation step can be performed by interleaving the circuits for the real and imaginary parts in a complex function. It leads to a lower hardware overhead (about 7/(4n+8), where n is the word length), and the error detection capability is as robust as that of the duplicated module technique. The CED butterfly is designed in 1.2-μm CMOS technology, using the structural silicon complier. The theoretical analysis and experimental results are presented. It is shown that the design is very attractive for real-time high-reliability DSP systems. Its regular structure make the proposed algorithm and architecture easy to implement in VLSI or WSI
Keywords :
CMOS integrated circuits; VLSI; circuit reliability; digital signal processing chips; error detection; fast Fourier transforms; fault tolerant computing; parallel architectures; pipeline processing; real-time systems; redundancy; 1.2 micron; CMOS technology; FFT; VLSI; WSI; butterfly chip; concurrent error detection; direct complex computation; exchanging design strategy; fast Fourier transform; high-reliability DSP systems; real-time FFT processing; recomputation step; structural silicon complier; time redundancy; CMOS technology; Chip scale packaging; Circuits; Digital signal processing; Fast Fourier transforms; Hardware; Interleaved codes; Real time systems; Robustness; Silicon;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.229402
Filename :
229402
Link To Document :
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