• DocumentCode
    929044
  • Title

    The development of Cu bonding wire with oxidation-resistant metal coating

  • Author

    Kaimori, Shingo ; Nonaka, Tsuyoshi ; Mizoguchi, Akira

  • Author_Institution
    Electron. & Mater. R&D Labs., Sumitomo Electr. Ind. Ltd., Osaka, Japan
  • Volume
    29
  • Issue
    2
  • fYear
    2006
  • fDate
    5/1/2006 12:00:00 AM
  • Firstpage
    227
  • Lastpage
    231
  • Abstract
    Although Cu bonding wire excels over Au bonding wire in some respects such as production costs, it has not been widely used because of its poor bondability at second bonds due to surface oxidation. We conceived an idea of electroplating oxidation-resistant metal on the Cu bonding wire to prevent the surface oxidation. The electroplating of Au, Ag, Pd, and Ni over Cu bonding wire all increased bond strengths as expected, but it caused problematic ball shapes except Pd-plated Cu bonding wire. The wire could produce the same ball shape as that of Au bonding wire. It was also proved to have excellent bondability sufficient to replace Au bonding wire. That is, it excelled in bond strengths, defective bonding ratio, and wideness of "Parameter Windows". It also showed the same stability as Au bonding wire in reliability tests, while bonds of Cu bonding wire were deteriorated in a few of the tests. In short, the Pd-plated Cu bonding wire can realize excellent bonding similar to Au bonding wire, while having much lower production costs.
  • Keywords
    copper; electroplating; gold; lead bonding; nickel; oxidation; palladium; reliability; silver; Ag; Au; Cu; Ni; Pd; bond strengths; copper bonding wire; defective bonding ratio; electroplating; gold bonding wire; oxidation-resistant metal coating; parameter windows; reliability tests; Bonding; Coatings; Costs; Gold; Oxidation; Production; Shape; Stability; Testing; Wire; Copper; bondability; bonding wire; electroplating; melting point; oxidation-resistance; palladium; reliability test; wettability;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/TADVP.2006.872999
  • Filename
    1629164