• DocumentCode
    929146
  • Title

    Grain-size dependence of temperature coefficient of resistance of polycrystalline metal films

  • Author

    Singh, Awatar

  • Author_Institution
    Central Electronics Engineering Research Institute, Pilani, India
  • Volume
    61
  • Issue
    11
  • fYear
    1973
  • Firstpage
    1653
  • Lastpage
    1654
  • Abstract
    The dependence of temperature coefficient of resistance of polycrystalline thin silver film on grain size diameter has been investigated theoretically. It has been found that it decreases with the decrease of grain size. For very small grain size, it is less than the bulk value and is negative in some cases, whereas for very large grain size it approaches the bulk value.
  • Keywords
    Eigenvalues and eigenfunctions; Equations; Grain size; Inorganic materials; Iterative methods; Laser theory; Masers; Optical films; Temperature dependence; Thermal resistance;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1973.9345
  • Filename
    1451275
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=929146