Title :
EPIC: profiling the propagation and effect of data errors in software
Author :
Hiller, Martin ; Jhumka, Arshad ; Suri, Neeraj
Author_Institution :
Dept. of Electron. & Software, Volvo Technol. Corp., Gothenburg, Sweden
fDate :
5/1/2004 12:00:00 AM
Abstract :
We present an approach for analyzing the propagation and effect of data errors in modular software enabling the profiling of the vulnerabilities of software to find 1) the modules and signals most likely exposed to propagating errors and 2) the modules and signals which, when subjected to error, tend to cause more damage than others from a systems operation point-of-view. We discuss how to use the obtained profiles to identify where dependability structures and mechanisms will likely be the most effective, i.e., how to perform a cost-benefit analysis for dependability. A fault-injection-based method for estimation of the various measures is described and the software of a real embedded control system is profiled to show the type of results obtainable by the analysis framework.
Keywords :
cost-benefit analysis; embedded systems; error handling; software cost estimation; software reliability; EPIC; cost-benefit analysis; data error effect; data error propagation; dependability assessment; embedded control system; fault-injection-based method; modular software; software cost estimation; software profiling; Cause effect analysis; Computer errors; Cost benefit analysis; Embedded software; Failure analysis; Hardware; Robustness; Signal analysis; Software measurement; Software safety;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.2004.1275294