Title :
A method enabling feasible conformance test sequence generation for EFSM models
Author :
Duale, Ali Y. ; Uyar, M. Ümit
Author_Institution :
IBM, Poughkeepsie, NY, USA
fDate :
5/1/2004 12:00:00 AM
Abstract :
A formal description of an implementation under test (IUT), such as its VHDL behavior description, is required to automatically generate feasible test sequences for the IUT. Although finite-state machines (FSMs) can be used to describe the control structures of communication protocols, the data portion can only be modeled by extended finite-state machines (EFSMs). However, infeasible paths due to the conflicts among the condition and action variables of EFSMs complicate the test generation process. We introduce a method enabling the automatic generation of realizable test sequences from a class of EFSMs. Algorithms to detect and eliminate conflicts caused by the interdependences among the variables of a class of EFSM models are presented. After all conflicts are eliminated from the EFSM graph, the existing FSM-based automated test generation methods can be used to generate feasible test sequences. Recently, these algorithms have been implemented as a software package called INDEEL. This methodology is applied to generate feasible tests for protocols such as ACA and MIL-STD 188-220. Current applications include IETF protocols and ASAP.
Keywords :
automatic test pattern generation; computational complexity; conformance testing; finite state machines; graph theory; hardware description languages; protocols; software packages; ACA; ASAP; EFSM graph; FSM-based automated test generation methods; IETF protocols; INDEEL; MIL-STD 188-220; VHDL behavior description; communication protocols; conformance test sequence generation; extended finite-state machines; software package; Automatic control; Automatic testing; Communication system control; Computer errors; Context modeling; Manufacturing; Natural languages; Protocols; Software algorithms; System testing;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.2004.1275300