• DocumentCode
    929454
  • Title

    Design verification by test vectors and arithmetic transform universal test set

  • Author

    Radecka, Katarzyna ; Zilic, Zeljko

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, Que., Canada
  • Volume
    53
  • Issue
    5
  • fYear
    2004
  • fDate
    5/1/2004 12:00:00 AM
  • Firstpage
    628
  • Lastpage
    640
  • Abstract
    We investigate methodology for simulation-based verification under a fault model. Since it is currently not feasible to describe a comprehensive explicit model of design errors, we propose an implicit fault model. The model is based on the arithmetic transform (AT) spectral representation of faults. The verification of circuits under the small errors in spectral domain is then performed by the universal test set (UTS) approach to test vector generation. The major result shows that, for errors whose AT has at most t nonzero coefficients, there exist the UTS test vector set of size O(n2log t). Consequently, verification confidence can be parameterized by the size of the error t, where at most O(n2log t) verification vectors are simulated to verify the absence of faults belonging to such an implicitly defined fault class. The experimental confirmation of the feasibility of verification using such UTS is presented, together with the relations between the arithmetic and Walsh-Hadamard spectra that bound the AT error spectrum and show that a class of small error circuits has small error spectrum. The proposed approach has the advantage of compatibility with formal verification and testing methods.
  • Keywords
    combinational circuits; fault simulation; formal verification; logic design; logic gates; logic testing; spectral analysis; transforms; AT error spectrum; Reed-Muller transform; Walsh-Hadamard spectral method; arithmetic transform universal test set; error circuits; error modeling; fault model; formal design verification; simulation-based verification; test vector generation; Arithmetic; Boolean functions; Circuit faults; Circuit simulation; Circuit testing; Data structures; Formal verification; Microprocessors; Performance evaluation; Polynomials;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.2004.1275301
  • Filename
    1275301