Title :
Injection locking of punched-through-injection transit-time oscillators
Author :
Gordon, B.J. ; Stover, H.L.
Author_Institution :
University of Southern California, Los Angeles, Calif.
Abstract :
Injection-locking experiments have been conducted with the punched-through-diode oscillator, and the results have agreed well with theory. This confirms the nature of oscillations to be of a negative-resistance type and not of a relaxation type.
Keywords :
Bandwidth; Circuit testing; Copper; Diodes; Frequency; Injection-locked oscillators; Microwave circuits; Microwave devices; Microwave oscillators; Thermal resistance;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1973.9375
