Title :
Automatic measurement of complex dielectric constant and permeability at microwave frequencies
Author :
Weir, William B.
Author_Institution :
Stanford Research Institute, Menlo Park, Calif.
Abstract :
With the advent of the computer and automatic test equipment, new techniques for measuring complex dielectric constant (ε) and permeability (µ) can be considered. Such a technique is described where a system is employed that automatically measures the complex reflection and transmission coefficients that result when a sample of material is inserted in waveguide or a TEM transmission line. Measurement results of ε and µ for two common materials are presented.
Keywords :
Automatic test equipment; Dielectric constant; Dielectric materials; Dielectric measurements; Frequency measurement; Microwave frequencies; Microwave measurements; Permeability measurement; Reflection; Transmission line measurements;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1974.9382