Title :
A MESFET Variable-Capacitance Model for GaAs Integrated Circuit Simulation
Author :
Takada, Tatsuo ; Yokoyama ; Kiyoyuki ; Ida, Minoru ; Sudo, Toshio
fDate :
5/1/1982 12:00:00 AM
Abstract :
A simple MESFET capacitance model which has a clearly explained physical meaning for a wide bias voltage range has been developed for use in simulations of GaAs integrated circuits. In this model, gate-source, gate-drain capacitances are represented by analytical expressions which are classified into three different regions for bias voltages: a before-pinch-off region including the neighborhood of the built-in voltage, an after-pinch-off region, a transition region. 2-dimensional analysis results support the validity of the analytically derived capacitance model. The model is applicable to MESFET´s used in integrated circuits that have low donor-thickness product.
Keywords :
Capacitance; Equivalent circuits; FETs; Gallium arsenide; Integrated circuit modeling; Logic; MESFET circuits; MESFET integrated circuits; Space charge; Voltage;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1982.1131127