DocumentCode
929972
Title
On the edge-thermal resistance (ICs)
Author
Sood, Arun K.
Author_Institution
George Mason Univ., Fairfax, VA, USA
Volume
13
Issue
4
fYear
1993
Firstpage
52
Lastpage
58
Abstract
Thermal characteristics of integrated circuits (ICs) have long been a major concern for both manufacturers and users of electronic products. An increase in junction temperature can adversely affect the long-term performance and operating life of an IC. Several variables affect junction temperature. The IC vendor controls some of these; the user and the environment in which the device is operated control others. With the continuing trend toward denser and more complex circuits and a growing number of pins, total power dissipation is increasing. Hence management of thermal characteristics remains a valid concern. Heat transfer processes are reviewed, and various methods available for predicting die temperature are discussed.<>
Keywords
heat sinks; integrated circuit manufacture; packaging; thermal insulation; heat transfer; integrated circuits; junction temperature; operating life; power dissipation; thermal resistance; Application software; Consumer electronics; Electronic packaging thermal management; Hardware; Heat sinks; Manufacturing; Resistance heating; Temperature; Thermal resistance; Thermal variables control;
fLanguage
English
Journal_Title
Micro, IEEE
Publisher
ieee
ISSN
0272-1732
Type
jour
DOI
10.1109/40.229716
Filename
229716
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