• DocumentCode
    929972
  • Title

    On the edge-thermal resistance (ICs)

  • Author

    Sood, Arun K.

  • Author_Institution
    George Mason Univ., Fairfax, VA, USA
  • Volume
    13
  • Issue
    4
  • fYear
    1993
  • Firstpage
    52
  • Lastpage
    58
  • Abstract
    Thermal characteristics of integrated circuits (ICs) have long been a major concern for both manufacturers and users of electronic products. An increase in junction temperature can adversely affect the long-term performance and operating life of an IC. Several variables affect junction temperature. The IC vendor controls some of these; the user and the environment in which the device is operated control others. With the continuing trend toward denser and more complex circuits and a growing number of pins, total power dissipation is increasing. Hence management of thermal characteristics remains a valid concern. Heat transfer processes are reviewed, and various methods available for predicting die temperature are discussed.<>
  • Keywords
    heat sinks; integrated circuit manufacture; packaging; thermal insulation; heat transfer; integrated circuits; junction temperature; operating life; power dissipation; thermal resistance; Application software; Consumer electronics; Electronic packaging thermal management; Hardware; Heat sinks; Manufacturing; Resistance heating; Temperature; Thermal resistance; Thermal variables control;
  • fLanguage
    English
  • Journal_Title
    Micro, IEEE
  • Publisher
    ieee
  • ISSN
    0272-1732
  • Type

    jour

  • DOI
    10.1109/40.229716
  • Filename
    229716