DocumentCode :
929972
Title :
On the edge-thermal resistance (ICs)
Author :
Sood, Arun K.
Author_Institution :
George Mason Univ., Fairfax, VA, USA
Volume :
13
Issue :
4
fYear :
1993
Firstpage :
52
Lastpage :
58
Abstract :
Thermal characteristics of integrated circuits (ICs) have long been a major concern for both manufacturers and users of electronic products. An increase in junction temperature can adversely affect the long-term performance and operating life of an IC. Several variables affect junction temperature. The IC vendor controls some of these; the user and the environment in which the device is operated control others. With the continuing trend toward denser and more complex circuits and a growing number of pins, total power dissipation is increasing. Hence management of thermal characteristics remains a valid concern. Heat transfer processes are reviewed, and various methods available for predicting die temperature are discussed.<>
Keywords :
heat sinks; integrated circuit manufacture; packaging; thermal insulation; heat transfer; integrated circuits; junction temperature; operating life; power dissipation; thermal resistance; Application software; Consumer electronics; Electronic packaging thermal management; Hardware; Heat sinks; Manufacturing; Resistance heating; Temperature; Thermal resistance; Thermal variables control;
fLanguage :
English
Journal_Title :
Micro, IEEE
Publisher :
ieee
ISSN :
0272-1732
Type :
jour
DOI :
10.1109/40.229716
Filename :
229716
Link To Document :
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