• DocumentCode
    930207
  • Title

    Circuit simulation by hierarchical waveform relaxation

  • Author

    Saviz, Peter ; Wing, Omar

  • Author_Institution
    Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
  • Volume
    12
  • Issue
    6
  • fYear
    1993
  • fDate
    6/1/1993 12:00:00 AM
  • Firstpage
    845
  • Lastpage
    860
  • Abstract
    A circuit analysis method, the hierarchical waveform relaxation technique, that uses multilevel decomposition and relaxation techniques is presented. Sufficient conditions for the convergence of the process are discussed, and a dynamic circuit restructuring technique that uses the concept of sensitivity based subcircuit merging and repartitioning within the hierarchical framework to improve the robustness of the simulation algorithm as well as the speed of convergence is presented. The algorithm is implemented in the circuit simulation program PYRAMID, and test results are compared with those obtained by other methods of analysis. The comparison indicates that this method produces better results than had previously been possible for a large range of circuits of practical interest, particularly strongly coupled digital bipolar and FET circuits containing bidirectionality and feedback, and it is demonstrated that the relative improvement of the method scales with the size of the circuit
  • Keywords
    circuit analysis computing; convergence; relaxation theory; PYRAMID; circuit analysis method; circuit simulation program; convergence; dynamic circuit restructuring; hierarchical waveform relaxation; multilevel decomposition; repartitioning; sensitivity; simulation algorithm; subcircuit merging; Algorithm design and analysis; Circuit analysis; Circuit simulation; Circuit testing; Convergence; Coupling circuits; Feedback circuits; Merging; Robustness; Sufficient conditions;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.229760
  • Filename
    229760