DocumentCode
930909
Title
Static characteristics of extremely thin gate oxide m.o.s. transistors
Author
Yutaka, Hayashi
Author_Institution
Electrotechnical Laboratory, Tokyo, Japan
Volume
11
Issue
25
fYear
1975
Firstpage
618
Lastpage
620
Abstract
The drain current of an extremely thin gate oxide m.o.s. transistor shows an exponential dependence both on drain voltage and gate voltage, even in the `postthreshold¿ region. The input gate current of a device with 20 Ã
gate oxide is estimated to be negligible for a logic-circuit operation with 0.2 V supply voltage.
Keywords
field effect transistors; MOST; drain current; extremely thin gate oxide; static characteristics;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19750471
Filename
4237001
Link To Document