• DocumentCode
    930909
  • Title

    Static characteristics of extremely thin gate oxide m.o.s. transistors

  • Author

    Yutaka, Hayashi

  • Author_Institution
    Electrotechnical Laboratory, Tokyo, Japan
  • Volume
    11
  • Issue
    25
  • fYear
    1975
  • Firstpage
    618
  • Lastpage
    620
  • Abstract
    The drain current of an extremely thin gate oxide m.o.s. transistor shows an exponential dependence both on drain voltage and gate voltage, even in the `postthreshold¿ region. The input gate current of a device with 20 Å gate oxide is estimated to be negligible for a logic-circuit operation with 0.2 V supply voltage.
  • Keywords
    field effect transistors; MOST; drain current; extremely thin gate oxide; static characteristics;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19750471
  • Filename
    4237001