DocumentCode
931251
Title
The Effect of Impurity Migrations on Thermionic Emission from Oxide Cathodes
Author
Levy, Irving E.
Author_Institution
Raytheon Manufacturing Co., Newton, Mass.
Volume
41
Issue
3
fYear
1953
fDate
3/1/1953 12:00:00 AM
Firstpage
365
Lastpage
368
Abstract
A comparison of thermionic emission from oxide cathodes with different base alloys showed the dependence of the work function on migrating impurities from tube parts other than the cathode. The effect of the base metal alone could be evaluated properly only by the use of a special diode structure which did not contribute any impurities toward the reduction of the oxide-coating. In the test method used, saturated emission was measured but the anode voltage was kept below the decomposition energies of most of the compounds apt to be found on the plate.
Keywords
Aluminum alloys; Cathodes; Copper alloys; Impurities; Iron alloys; Manganese alloys; Nickel alloys; Semiconductor diodes; Silicon alloys; Thermionic emission;
fLanguage
English
Journal_Title
Proceedings of the IRE
Publisher
ieee
ISSN
0096-8390
Type
jour
DOI
10.1109/JRPROC.1953.274383
Filename
4051319
Link To Document