• DocumentCode
    931251
  • Title

    The Effect of Impurity Migrations on Thermionic Emission from Oxide Cathodes

  • Author

    Levy, Irving E.

  • Author_Institution
    Raytheon Manufacturing Co., Newton, Mass.
  • Volume
    41
  • Issue
    3
  • fYear
    1953
  • fDate
    3/1/1953 12:00:00 AM
  • Firstpage
    365
  • Lastpage
    368
  • Abstract
    A comparison of thermionic emission from oxide cathodes with different base alloys showed the dependence of the work function on migrating impurities from tube parts other than the cathode. The effect of the base metal alone could be evaluated properly only by the use of a special diode structure which did not contribute any impurities toward the reduction of the oxide-coating. In the test method used, saturated emission was measured but the anode voltage was kept below the decomposition energies of most of the compounds apt to be found on the plate.
  • Keywords
    Aluminum alloys; Cathodes; Copper alloys; Impurities; Iron alloys; Manganese alloys; Nickel alloys; Semiconductor diodes; Silicon alloys; Thermionic emission;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IRE
  • Publisher
    ieee
  • ISSN
    0096-8390
  • Type

    jour

  • DOI
    10.1109/JRPROC.1953.274383
  • Filename
    4051319