DocumentCode :
931512
Title :
Simulation of high-power 4H-SiC MESFETs with 3D tri-gate structure
Author :
Zhang, J. ; Zhang, B. ; Li, Z.
Author_Institution :
Center of IC Design, Univ. of Electron. Sci. & Technol. of China, Chengdu Sichuan
Volume :
43
Issue :
12
fYear :
2007
Firstpage :
692
Lastpage :
694
Abstract :
A novel 3D tri-gate 4H-SiC MESFET structure is proposed for high-power RF applications. In comparison with the conventional structure, improved saturation drain current is obtained owing to the formation of a vertical channel, which induces device equivalent channel width increase. The output power density of the proposed structure with t=2 mum, a=0.4 mum and w=0.6 mum is 15.5 W/mm compared to 4.2 W/mm for the conventional one and yet it maintains almost the same cutoff frequency (fT) and maximum oscillation frequency (fmax )
Keywords :
power MESFET; silicon compounds; wide band gap semiconductors; 3D tri-gate structure; SiC; device equivalent channel; drain current; high-power MESFET; high-power RF applications;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:20070777
Filename :
4237065
Link To Document :
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