• DocumentCode
    931607
  • Title

    Edge detection and linear feature extraction using a 2-D random field model

  • Author

    Zhou, Y.T. ; Venkateswar, V. ; Chellappa, R.

  • Author_Institution
    Dept. of Electr. Eng. Syst., Univ. of Southern California, Los Angeles, CA, USA
  • Volume
    11
  • Issue
    1
  • fYear
    1989
  • fDate
    1/1/1989 12:00:00 AM
  • Firstpage
    84
  • Lastpage
    95
  • Abstract
    The edge-detection problem is posed as one of detecting step discontinuities in the observed correlated image, using directional derivatives estimated with a random field model. Specifically, the method consists of representing the pixels in a local window by a 2-D causal autoregressive (AR) model, whose parameters are adaptively estimated using a recursive least-squares algorithm. The directional derivatives are functions of parameter estimates. An edge is detected if the second derivative in the direction of the estimated maximum gradient is negatively sloped and the first directional derivative and a local estimate of variance satisfy some conditions. Because the ordered edge detector may not detect edges of all orientations well, the image scanned in four different directions, and the union of the four edge images is taken as the final output. The performance of the edge detector is illustrated using synthetic and real images. Comparisons to other edge detectors are given. A linear feature extractor that operates on the edges produced by the AR model is presented
  • Keywords
    parameter estimation; pattern recognition; picture processing; statistical analysis; 2D causal autoregressive model; 2D random field model; directional derivatives; edge detection; edge detector; linear feature extraction; parameter estimation; pattern recognition; picture processing; recursive least-squares algorithm; Computer vision; Detectors; Face detection; Feature extraction; Image edge detection; Least squares approximation; Parameter estimation; Recursive estimation; Signal processing; Testing;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.23115
  • Filename
    23115