• DocumentCode
    931704
  • Title

    Measurement and Analysis of Periodic Coupling in Silicon-Clad Planar Waveguides

  • Author

    Wright, Glen M Mc ; Batchman, E. ; Stanziano, M.S.

  • Volume
    30
  • Issue
    10
  • fYear
    1982
  • Firstpage
    1753
  • Lastpage
    1759
  • Abstract
    Computer modeling studies indicate that planar dielectric waveguides clad with silicon exhibit a damped periodic oscillation in their attenuation and phase characteristics. The effect is due to a periodic coupling between the lossy, guided modes in the silicon film and the TE 0 mode of the dielectric waveguide. Experimental confirmation of the periodic coupling for a wavelength of 632.8 nm is presented. Propagation characteristics for a wavelength of 1150 nm were investigated for application in integrated optical modulators. Frequency filtering properties, of silicon-clad waveguides are also examined and it is shown that the silicon thickness controls the filter response curve.
  • Keywords
    Attenuation; Dielectric losses; Dielectric measurements; Optical films; Optical filters; Optical losses; Optical modulation; Optical waveguides; Planar waveguides; Silicon;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.1982.1131317
  • Filename
    1131317