DocumentCode
931779
Title
Second breakdown: Hot spots or hot cylinders
Author
Krishna, Surinder ; Gray, Peter
Author_Institution
General Electric Company, Schenectady, N.Y.
Volume
62
Issue
8
fYear
1974
Firstpage
1182
Lastpage
1183
Abstract
An extension of the lateral thermal instability effects that give rise to second breakdown in transistors is presented. It is seen that regions where intrinsic ionization occurs are not localized "spots" but are present in the center of the emitter and along its entire length, giving rise to "hot cylinders."
Keywords
Admittance; Artificial intelligence; Circuits; Electric breakdown; Equations; Frequency; Power system transients; Rotors; Sparse matrices; Synchronous machines;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1974.9589
Filename
1451519
Link To Document