DocumentCode :
931828
Title :
Scanning the issue
Author :
Reich, B. ; McCaughan, D.V.
Author_Institution :
U.S. Army Electronics Technology and Devices Laboratory, Fort Monmouth, N.J.
Volume :
62
Issue :
9
fYear :
1974
Firstpage :
1188
Lastpage :
1189
Abstract :
Provides an overview of the technical articles and features presented in this issue.
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1974.9594
Filename :
1451524
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=931828