DocumentCode :
931867
Title :
Photon-induced charge transfer and surface emission
Author :
Barlett, Robert H. ; Fulk, Gerald A. ; Hofer, Walter W. ; Meeker, Donald J. ; Lee, Ronald S. ; Weingart, Richard C.
Author_Institution :
University of California, Livermore, Calif.
Volume :
62
Issue :
9
fYear :
1974
Firstpage :
1215
Lastpage :
1220
Abstract :
Experimental measurements have been made of photon-induced charge transfer between plane-parallel electrodes. X-rays from a pulsed X-ray source were directed at near-normal incidence onto plane-parallel electrodes, and the current which flowed between the electrodes during the X-ray pulse was measured. Quantities obtained include bulk charge transfer in several dielectric materials; forward and reverse electron emission from Al, Cu, and Au surfaces; and secondary electron emission coefficients for these metals and selected dielectrics. Measured values for charge transfer and surface emission are compared with calculations.
Keywords :
Charge measurement; Charge transfer; Current measurement; Dielectric materials; Dielectric measurements; Electrodes; Electron emission; Gold; Pulse measurements; X-rays;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1974.9598
Filename :
1451528
Link To Document :
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