• DocumentCode
    931867
  • Title

    Photon-induced charge transfer and surface emission

  • Author

    Barlett, Robert H. ; Fulk, Gerald A. ; Hofer, Walter W. ; Meeker, Donald J. ; Lee, Ronald S. ; Weingart, Richard C.

  • Author_Institution
    University of California, Livermore, Calif.
  • Volume
    62
  • Issue
    9
  • fYear
    1974
  • Firstpage
    1215
  • Lastpage
    1220
  • Abstract
    Experimental measurements have been made of photon-induced charge transfer between plane-parallel electrodes. X-rays from a pulsed X-ray source were directed at near-normal incidence onto plane-parallel electrodes, and the current which flowed between the electrodes during the X-ray pulse was measured. Quantities obtained include bulk charge transfer in several dielectric materials; forward and reverse electron emission from Al, Cu, and Au surfaces; and secondary electron emission coefficients for these metals and selected dielectrics. Measured values for charge transfer and surface emission are compared with calculations.
  • Keywords
    Charge measurement; Charge transfer; Current measurement; Dielectric materials; Dielectric measurements; Electrodes; Electron emission; Gold; Pulse measurements; X-rays;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1974.9598
  • Filename
    1451528