Title :
Testable design of RMC networks with universal tests for detecting stuck-at and bridging faults
Author :
Bhattacharya, B.B. ; Gupta, B. ; Sarkar, Santonu ; Choudhury, A.K.
Author_Institution :
Indian Statistical Institute, Electronics Unit, Calcutta, India
fDate :
5/1/1985 12:00:00 AM
Abstract :
In the paper we investigate whether the function-independent test set for detecting single stuck-at faults in networks realising Reed-Muller canonic (RMC) expansions of switching functions is sufficient to detect all bridging faults in such networks. The investigation, however, reveals its insufficiency, and to circumvent this we propose a technique of augmenting the network with some additional observation points, so that a universal test set can be designed for detecting bridging faults as well.
Keywords :
fault location; field effect integrated circuits; integrated logic circuits; large scale integration; logic design; logic testing; MOS LSI; RMC networks; Reed-Muller canonic expansions; bridging faults; stuck-at faults detection; switching functions; testable design; universal tests;
Journal_Title :
Computers and Digital Techniques, IEE Proceedings E
DOI :
10.1049/ip-e.1985.0022