• DocumentCode
    932331
  • Title

    Testable design of RMC networks with universal tests for detecting stuck-at and bridging faults

  • Author

    Bhattacharya, B.B. ; Gupta, B. ; Sarkar, Santonu ; Choudhury, A.K.

  • Author_Institution
    Indian Statistical Institute, Electronics Unit, Calcutta, India
  • Volume
    132
  • Issue
    3
  • fYear
    1985
  • fDate
    5/1/1985 12:00:00 AM
  • Firstpage
    155
  • Lastpage
    162
  • Abstract
    In the paper we investigate whether the function-independent test set for detecting single stuck-at faults in networks realising Reed-Muller canonic (RMC) expansions of switching functions is sufficient to detect all bridging faults in such networks. The investigation, however, reveals its insufficiency, and to circumvent this we propose a technique of augmenting the network with some additional observation points, so that a universal test set can be designed for detecting bridging faults as well.
  • Keywords
    fault location; field effect integrated circuits; integrated logic circuits; large scale integration; logic design; logic testing; MOS LSI; RMC networks; Reed-Muller canonic expansions; bridging faults; stuck-at faults detection; switching functions; testable design; universal tests;
  • fLanguage
    English
  • Journal_Title
    Computers and Digital Techniques, IEE Proceedings E
  • Publisher
    iet
  • ISSN
    0143-7062
  • Type

    jour

  • DOI
    10.1049/ip-e.1985.0022
  • Filename
    4646483