DocumentCode :
932331
Title :
Testable design of RMC networks with universal tests for detecting stuck-at and bridging faults
Author :
Bhattacharya, B.B. ; Gupta, B. ; Sarkar, Santonu ; Choudhury, A.K.
Author_Institution :
Indian Statistical Institute, Electronics Unit, Calcutta, India
Volume :
132
Issue :
3
fYear :
1985
fDate :
5/1/1985 12:00:00 AM
Firstpage :
155
Lastpage :
162
Abstract :
In the paper we investigate whether the function-independent test set for detecting single stuck-at faults in networks realising Reed-Muller canonic (RMC) expansions of switching functions is sufficient to detect all bridging faults in such networks. The investigation, however, reveals its insufficiency, and to circumvent this we propose a technique of augmenting the network with some additional observation points, so that a universal test set can be designed for detecting bridging faults as well.
Keywords :
fault location; field effect integrated circuits; integrated logic circuits; large scale integration; logic design; logic testing; MOS LSI; RMC networks; Reed-Muller canonic expansions; bridging faults; stuck-at faults detection; switching functions; testable design; universal tests;
fLanguage :
English
Journal_Title :
Computers and Digital Techniques, IEE Proceedings E
Publisher :
iet
ISSN :
0143-7062
Type :
jour
DOI :
10.1049/ip-e.1985.0022
Filename :
4646483
Link To Document :
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