DocumentCode
932373
Title
Knowledge-based test generation
Author
Schofield, M.J.
Author_Institution
Cirrus Computers Limited, Fareham, UK
Volume
132
Issue
3
fYear
1985
fDate
6/1/1985 12:00:00 AM
Firstpage
108
Lastpage
110
Abstract
One view of what constitutes a testable circuit design is that sufficient circuit knowledge exists to allow an effective test program to be generated. HITEST is a test-generation system based on the definition, capture and use of knowledge items about the elements and overall behaviour of the circuit. The paper describes the general form of the knowledge items and indicates how the system makes use of and is constrained by the knowledge.
Keywords
circuit CAD; expert systems; integrated circuit testing; logic CAD; logic testing; CAD; HITEST; IC testing; computer-aided design; knowledge-based system; logic testing; test-generation system; testable circuit design;
fLanguage
English
Journal_Title
Electronic Circuits and Systems, IEE Proceedings G
Publisher
iet
ISSN
0143-7089
Type
jour
DOI
10.1049/ip-g-1:19850023
Filename
4646488
Link To Document