DocumentCode :
932531
Title :
Analysis of Trapped Image Guides Using Effective Dielectric Constant and Surface Impedances
Author :
Zhou, Wen-biao ; Itoh, Tatsuo
Volume :
30
Issue :
12
fYear :
1982
Firstpage :
2163
Lastpage :
2166
Abstract :
A method has been introduced to accurately predict dispersion characteristics of the trapped image guide. Numerical results agreed much better with experimental results than those previously calculated by a simple effective dielectric constant (EDC) approach especially at the low frequency end.
Keywords :
Dielectric constant; Dielectric losses; Eigenvalues and eigenfunctions; Frequency; Image analysis; Region 1; Region 5; Slabs; Surface impedance; Waveguide junctions;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.1982.1131401
Filename :
1131401
Link To Document :
بازگشت