Title :
Low-cost residue codes and their application to self-checking VLSI systems
Author :
Sayers, I.L. ; Kinniment, D.J.
Author_Institution :
University of Newcastle upon Tyne, Department of Electrical and Electronic Engineering, Newcastle upon Tyne, UK
fDate :
7/1/1985 12:00:00 AM
Abstract :
The efficient application of error-detecting codes to VLSI designs requires a study of their cost and effectiveness to supplement the knowledge of their theoretical properties. The paper discusses the tradeoffs for a low-cost residue code applied to common types of VLSI hardware. Comparisons are made between the kinds of residue codes available and their suitability for use in VLSI designs. The code is then applied to a typical VLSI system for comparison with other test strategies.
Keywords :
VLSI; error detection codes; integrated logic circuits; logic design; logic testing; error-detecting codes; low cost residue codes; self-checking VLSI systems;
Journal_Title :
Computers and Digital Techniques, IEE Proceedings E
DOI :
10.1049/ip-e.1985.0029
