DocumentCode :
932816
Title :
High-Power Self-Pinch Diode Experiments for Radiographic Applications
Author :
Hinshelwood, David D. ; Allen, Raymond J. ; Commisso, Robert J. ; Cooperstein, Gerlad ; Huhman, Brett M. ; Mosher, David ; Murphy, D.P. ; Ottinger, Paul F. ; Schumer, Joseph W. ; Swanekamp, Stephen B. ; Stephanakis, Stavros J. ; Weber, Bruce V. ; Young, F
Author_Institution :
Naval Res. Lab., Washington
Volume :
35
Issue :
3
fYear :
2007
fDate :
6/1/2007 12:00:00 AM
Firstpage :
565
Lastpage :
572
Abstract :
We report here on self-magnetic-pinch diode experiments at voltages from 3.5 to 6 MV. In addition to electrical diagnostics, the diode is characterized as a radiation source by dose and spot-size measurement. As the operating voltage increases, we find that a given diode geometry tends to produce a smaller spot but suffers from the reduced impedance lifetime. Optimization involves increasing the cathode diameter and diode gap as the voltage increases. We find a good quantitative agreement with the Monte Carlo code integrated tiger series over the entire data set, assuming an effective electron incidence angle of 20deg. Over this range, we observe favorable dose and spot scaling of optimized diode performance with voltage. Our best results are roughly 200-rad at 1 m with an ~2-mm-diameter spot. These were obtained at diode parameters of roughly 6 MV, 150 kA, and 30-ns radiation full-width at half-maximum.
Keywords :
particle beams; pinch effect; plasma X-ray sources; plasma diodes; pulsed power technology; radiography; Monte Carlo code integrated tiger series; cathode diameter; diode gap; diode geometry; dose measurement; electrical diagnostics; electron incidence angle; impedance lifetime; operating voltage; radiation source; radiography; self-magnetic-pinch diode experiment; spot-size measurement; Cathodes; Diodes; Electrons; Geometry; Impedance; Laboratories; Particle beams; Physics; Radiography; Voltage; Electron beams; particle beams; pinched-beam diodes; pulsed power; radiography;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2007.895227
Filename :
4237261
Link To Document :
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