• DocumentCode
    933079
  • Title

    Integral relations for determining non-quasi-static charge partitioning in bipolar devices from static charge distributions

  • Author

    Hamel, J.S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont.
  • Volume
    40
  • Issue
    9
  • fYear
    1993
  • fDate
    9/1/1993 12:00:00 AM
  • Firstpage
    1713
  • Lastpage
    1716
  • Abstract
    Integral relations are rigorously derived for the non-quasi-static charge partitioning in bipolar devices in terms of static carrier distributions in low-level injection. The resulting expressions are simpler than previous charge partitioning expressions for arbitrary impurity profiles and, in contrast to previous expressions, take into account minority-carrier recombination, which is required in the emitter region of bipolar transistors. The simplicity of the derived integral relations permits the development of a semianalytic expression for the charge partitioning in the base region which does not require a static minority carrier solution, and which is similar in computational complexity to the base transit line
  • Keywords
    bipolar transistors; electron-hole recombination; minority carriers; bipolar devices; bipolar transistors; emitter region; minority-carrier recombination; nonquasi-static charge partitioning; static charge distributions; Contact resistance; Electrical resistance measurement; Electron devices; Electron mobility; HEMTs; MODFETs; Moon; Scattering; Solids; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.231582
  • Filename
    231582