DocumentCode :
933079
Title :
Integral relations for determining non-quasi-static charge partitioning in bipolar devices from static charge distributions
Author :
Hamel, J.S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont.
Volume :
40
Issue :
9
fYear :
1993
fDate :
9/1/1993 12:00:00 AM
Firstpage :
1713
Lastpage :
1716
Abstract :
Integral relations are rigorously derived for the non-quasi-static charge partitioning in bipolar devices in terms of static carrier distributions in low-level injection. The resulting expressions are simpler than previous charge partitioning expressions for arbitrary impurity profiles and, in contrast to previous expressions, take into account minority-carrier recombination, which is required in the emitter region of bipolar transistors. The simplicity of the derived integral relations permits the development of a semianalytic expression for the charge partitioning in the base region which does not require a static minority carrier solution, and which is similar in computational complexity to the base transit line
Keywords :
bipolar transistors; electron-hole recombination; minority carriers; bipolar devices; bipolar transistors; emitter region; minority-carrier recombination; nonquasi-static charge partitioning; static charge distributions; Contact resistance; Electrical resistance measurement; Electron devices; Electron mobility; HEMTs; MODFETs; Moon; Scattering; Solids; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.231582
Filename :
231582
Link To Document :
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