Title :
A complete scheme of built-in self-tests (BIST) structure for fault diagnosis in analog circuits and systems
Author :
Hatzopoulos, Alkis A. ; Siskos, Stilianos ; Kontoleon, John M.
Author_Institution :
Aristotle Univ. of Thessaloniki, Greece
fDate :
6/1/1993 12:00:00 AM
Abstract :
The implementation of BIST in analog circuits is investigated, and a complete BIST scheme is proposed. This scheme can be included in any analog or mixed analog-digital circuit and can check its responses by following selected testing procedures. A CMOS chip supporting the proposed BIST structure is designed to facilitate the application of the scheme in a variety of analog circuits. Results from the application of the BIST scheme on active circuits are given, showing its effectiveness and its convenience
Keywords :
CMOS integrated circuits; active networks; analogue circuits; built-in self test; fault location; integrated circuit testing; linear integrated circuits; mixed analogue-digital integrated circuits; CMOS chip; VLSI; active circuits; analog circuits; built-in self-tests; fault diagnosis; lining error; mixed analog-digital circuit; Analog circuits; Analog-digital conversion; Built-in self-test; Circuit faults; Circuit testing; EPROM; Fault diagnosis; Sampling methods; Timing; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
