A complete scheme of built-in self-tests (BIST) structure for fault diagnosis in analog circuits and systems

Author

Hatzopoulos, Alkis A. ; Siskos, Stilianos ; Kontoleon, John M.

Author_Institution

Aristotle Univ. of Thessaloniki, Greece

Volume

42

Issue

3

fYear

1993

fDate

6/1/1993 12:00:00 AM

Firstpage

689

Lastpage

694

Abstract

The implementation of BIST in analog circuits is investigated, and a complete BIST scheme is proposed. This scheme can be included in any analog or mixed analog-digital circuit and can check its responses by following selected testing procedures. A CMOS chip supporting the proposed BIST structure is designed to facilitate the application of the scheme in a variety of analog circuits. Results from the application of the BIST scheme on active circuits are given, showing its effectiveness and its convenience

Keywords

CMOS integrated circuits; active networks; analogue circuits; built-in self test; fault location; integrated circuit testing; linear integrated circuits; mixed analogue-digital integrated circuits; CMOS chip; VLSI; active circuits; analog circuits; built-in self-tests; fault diagnosis; lining error; mixed analog-digital circuit; Analog circuits; Analog-digital conversion; Built-in self-test; Circuit faults; Circuit testing; EPROM; Fault diagnosis; Sampling methods; Timing; Voltage;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.231591

Filename

231591