DocumentCode :
933252
Title :
A parallel algorithm for locating short circuits on printed circuit boards
Author :
Leung, Yiu-Wing
Author_Institution :
Dept. of Inf. Eng., Chinese Univ. of Hong Kong, Shatin, Hong Kong
Volume :
42
Issue :
3
fYear :
1993
fDate :
6/1/1993 12:00:00 AM
Firstpage :
746
Lastpage :
751
Abstract :
To locate all the short circuits on a printed circuit board, S.C. Fang (1990) proposed an efficient algorithm that finds the shorted paths one by one and groups these shorted paths into equivalence classes. By properly grouping the signal paths and testing one group of signal paths against another group at a time, Fang showed that this algorithm has the worst-case complexity O(χ log2 N), where N and χ are the numbers of signal paths and shorted paths, respectively. A parallel algorithm based on Fang´s algorithm is proposed for locating all the short circuits on a printed circuit board. By using M current sources of different frequencies and M bandpass filters with different passbands, this algorithm tests M groups of signal paths against M respective groups simultaneously. It is shown that this algorithm has worst-case complexity O(χ logM N) and a much smaller average complexity than Fang´s algorithm
Keywords :
automatic testing; band-pass filters; computational complexity; electronic engineering computing; fault location; parallel algorithms; printed circuit testing; short-circuit currents; Fang´s algorithm; PCB fault location; automatic testing; average complexity; bandpass filters; current sources; parallel algorithm; printed circuit boards; short circuits; signal paths; testing; worst-case complexity; Band pass filters; Circuit testing; Detectors; Electronic components; Electronic equipment testing; Frequency; Instruments; Manufacturing; Parallel algorithms; Printed circuits;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.231601
Filename :
231601
Link To Document :
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