Title :
The influence of metallization thickness on the characteristics of cascaded junction discontinuities of shielded coplanar type transmission line
Author :
Huang, Tian-Wei ; Itoh, Tatsuo
Author_Institution :
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
fDate :
4/1/1993 12:00:00 AM
Abstract :
A full-wave analysis based on the mode-matching technique is applied to analyze cascaded junction discontinuities of coplanar-type transmission lines, coplanar waveguide (CPW) and finline. Results for a CPW-finline transition, a shielded CPW gap and a symmetric notch incorporating the finite metallization thickness effect are presented. The influence of metallization thickness on the coupling effect exhibited by cascaded junction discontinuities is also presented and discussed
Keywords :
fin lines; metallisation; strip lines; waveguide theory; CPW gap; CPW-finline transition; cascaded junction discontinuities; coplanar waveguide; coupling effect; finite thickness effect; finline; full-wave analysis; metallization thickness; mode-matching technique; shielded coplanar type; symmetric notch; transmission line; Coplanar transmission lines; Coplanar waveguides; Coupling circuits; Cutoff frequency; Dielectrics; MMICs; Metallization; Transmission line discontinuities; Waveguide discontinuities; Waveguide junctions;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
