The influence of metallization thickness on the characteristics of cascaded junction discontinuities of shielded coplanar type transmission line

Author

Huang, Tian-Wei ; Itoh, Tatsuo

Author_Institution

Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA

Volume

41

Issue

4

fYear

1993

fDate

4/1/1993 12:00:00 AM

Firstpage

693

Lastpage

697

Abstract

A full-wave analysis based on the mode-matching technique is applied to analyze cascaded junction discontinuities of coplanar-type transmission lines, coplanar waveguide (CPW) and finline. Results for a CPW-finline transition, a shielded CPW gap and a symmetric notch incorporating the finite metallization thickness effect are presented. The influence of metallization thickness on the coupling effect exhibited by cascaded junction discontinuities is also presented and discussed

Keywords

fin lines; metallisation; strip lines; waveguide theory; CPW gap; CPW-finline transition; cascaded junction discontinuities; coplanar waveguide; coupling effect; finite thickness effect; finline; full-wave analysis; metallization thickness; mode-matching technique; shielded coplanar type; symmetric notch; transmission line; Coplanar transmission lines; Coplanar waveguides; Coupling circuits; Cutoff frequency; Dielectrics; MMICs; Metallization; Transmission line discontinuities; Waveguide discontinuities; Waveguide junctions;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.231666

Filename

231666