Title :
Ballistic quantum transport in nanoscale Schottky-barrier tunnel transistors
Author :
Ahn, Chiyui ; Shin, Mincheol
Author_Institution :
Inf. & Commun. Univ., Daejeon, South Korea
fDate :
5/1/2006 12:00:00 AM
Abstract :
The device characteristics of the nanoscale Schottky-barrier tunnel transistor (SBTT) are investigated by solving the self-consistent two-dimensional Poisson-Schrodinger equations and treating the ballistic transport with the nonequilibrium Green´s function formalism. A main focus lies in the assessment of the device performance of the SBTT as the channel length is gradually reduced down to a few nanometers. Due to the assumed ballistic transport, the device characteristics are almost the same if the channel length is greater than about 20 nm, but the device performance starts to degrade below L=20 nm. By examining the device performance in terms of the voltage gain, transfer characteristics, and the threshold voltage behavior, we suggest that the channel length of the SBTT can be reduced to approximately 10 nm. Discussions on how scattering affects the simulation results and how to control on- and off-currents by varying the Schottky-barrier height and the gate dielectric constant are also presented.
Keywords :
Green´s function methods; MOSFET; Poisson equation; Schottky barriers; Schrodinger equation; ballistic transport; nanoelectronics; permittivity; tunnel transistors; MOSFET; ballistic quantum transport; gate dielectric constant; nanoscale Schottky-barrier tunnel transistors; nonequilibrium Green´s function formalism; self-consistent two-dimensional Poisson-Schrodinger equations; threshold voltage; voltage gain; Ballistic transport; Dielectric constant; Electrodes; Electrons; FETs; Insulation; MOSFETs; Nanoscale devices; Silicides; Threshold voltage; Nano field-effect transistor (FET); Schottky-barrier tunnel transistor; nonequilibrium Green´s function (NEGF); quantum transport;
Journal_Title :
Nanotechnology, IEEE Transactions on
DOI :
10.1109/TNANO.2006.874042