Title :
Transistor Reliability Studies
Author :
Ryder, R.M. ; Sittner, W.R.
Author_Institution :
Bell Telephone Lab., Murray Hill, N.J.
Abstract :
Factors affecting the useful life of transistors are discussed. From consideration of their structure, long life might well be expected, and has been shown to occur for usual laboratory conditions. However, under high humidity or high temperature, life is sometimes greatly shortened. Mechanisms of the effects are described. Corrective measures are under way.
Keywords :
Diseases; Humidity; Laboratories; Life estimation; Life testing; Senior members; Solids; Telephony; Temperature; Transistors;
Journal_Title :
Proceedings of the IRE
DOI :
10.1109/JRPROC.1954.274679
