DocumentCode
934054
Title
Transistor Reliability Studies
Author
Ryder, R.M. ; Sittner, W.R.
Author_Institution
Bell Telephone Lab., Murray Hill, N.J.
Volume
42
Issue
2
fYear
1954
Firstpage
414
Lastpage
419
Abstract
Factors affecting the useful life of transistors are discussed. From consideration of their structure, long life might well be expected, and has been shown to occur for usual laboratory conditions. However, under high humidity or high temperature, life is sometimes greatly shortened. Mechanisms of the effects are described. Corrective measures are under way.
Keywords
Diseases; Humidity; Laboratories; Life estimation; Life testing; Senior members; Solids; Telephony; Temperature; Transistors;
fLanguage
English
Journal_Title
Proceedings of the IRE
Publisher
ieee
ISSN
0096-8390
Type
jour
DOI
10.1109/JRPROC.1954.274679
Filename
4051619
Link To Document