Title :
Validation of Geant4 Atomic Relaxation Against the NIST Physical Reference Data
Author :
Guatelli, S. ; Mantero, A. ; Mascialino, B. ; Pia, M.G. ; Zampichelli, V.
Author_Institution :
INFN, Genova
fDate :
6/1/2007 12:00:00 AM
Abstract :
The accuracy of the Geant4 component for the simulation of atomic relaxation has been evaluated against the experimental measurements of the NIST Standard Reference Data. The validation study concerns X-ray and Auger transition energies. The comparison of the simulated and experimental data with rigorous statistical methods demonstrates the excellent accuracy of the simulation of atomic de-excitation in Geant4.
Keywords :
Auger effect; fluorescence; relaxation; standards; Auger transition energy; Geant4 atomic relaxation; NIST; X-ray transition energy; rigorous statistical methods; Atomic layer deposition; Atomic measurements; Electrons; Fluorescence; Measurement standards; Monte Carlo methods; NIST; Packaging; Physics; Statistical analysis; Auger electron; Geant4; Monte Carlo; fluorescence; simulation;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2007.894814
