DocumentCode :
9345
Title :
Approximation of the maximum frequency of operation for point-contact MIM diodes from DC current against voltage measurements
Author :
Snyder, G. ; Rhoades, C. ; Hagmann, M.J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Brigham Young Univ., Provo, UT, USA
Volume :
51
Issue :
7
fYear :
2015
fDate :
4 2 2015
Firstpage :
566
Lastpage :
568
Abstract :
Point-contact metal-insulator-metal (MIM) diodes have been used for detection and mixing at frequencies as high as 520 THz. In detection, the current responsivity (CR), defined as the change in the DC current caused by an incremental change in the high-frequency input power, depends on the dimensions of the diode and the test fixture. However, other researchers have shown that the intrinsic current responsivity (ICR) which sets an upper bound for the CR may be determined from DC current against voltage measurements. Additional calculations from DC measurements have been used to determine an upper bound for the maximum frequency of operation.
Keywords :
MIM devices; semiconductor diodes; ICR; dc current; intrinsic current responsivity; point-contact MIM diodes; point-contact metal-insulator-metal diodes; test fixture; voltage measurements;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2014.4449
Filename :
7073752
Link To Document :
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