Title :
Applications of electrical noise
Author :
Gupta, Madhu-Sudan
Author_Institution :
Massachusetts Institute of Technology, Cambridge, Mass.
fDate :
7/1/1975 12:00:00 AM
Abstract :
The omnipresent noise in electronic circuits and devices is generally considered undesirable. This paper describes some of the applications to which it has been put. Short descriptions of a wide variety of applications are given together with references for further details. The applications fall in four categories: applications in which noise is used as a broad-band random signal; measurements in which the random noise is used as a test signal; measurements in which noise is used as a probe into microscopic phenomena; and the applications where noise is a conceptual or theoretical tool. Many examples of applications in each of these categories are given. Some of the applications included are only of historical interest now, and a few are, as yet, only proposals.
Keywords :
Circuit noise; Diseases; Electronic circuits; Fluctuations; Helium; Microscopy; Noise measurement; Noise reduction; Pollution measurement; Probes;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1975.9877